The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 07, 2002
Filed:
May. 20, 2000
Ming Lai, Dublin, CA (US);
Carl Zeiss, Inc., Thornwood, NY (US);
Abstract
Embodiments of the present invention advantageously satisfy the above-identified need in the art, and provide method and apparatus for measuring refractive errors of an eye that improve upon wavefront type refractors using a conventional Hartmann-Shack sensor. Specifically, one embodiment of the present invention is an apparatus for measuring refractive errors of an eye which includes: (a) a source of a probe beam; (b) a first Badal lens system adapted to project the probe beam into a subject's eye to form an illumination spot on a retina; (c) a second Badal lens system adapted to image the illumination spot onto an image plane substantially conjugate to the retina; and (d) a spatial filter disposed in the image plane adapted to transmit at least a portion of the image.