The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 07, 2002

Filed:

Sep. 26, 2000
Applicant:
Inventor:

Donald E. Woodmansee, Simpsonville, SC (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 1/04 ;
U.S. Cl.
CPC ...
G01N 1/04 ;
Abstract

An apparatus for measuring surface particulate contamination includes a tool for collecting a contamination sample from a target surface, a mask having an opening of known area formed therein for defining the target surface, and a flexible connector connecting the tool to the mask. The tool includes a body portion having a large diameter section defining a surface and a small diameter section extending from the large diameter section. A particulate collector is removably mounted on the surface of the large diameter section for collecting the contaminants. The tool further includes a spindle extending from the small diameter section and a spool slidingly mounted on the spindle. A spring is disposed between the small diameter section and the spool for biasing the spool away from the small diameter section. An indicator is provided on the spindle so as to be revealed when the spool is pressed downward to compress the spring.


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Woodmansee, Donald. (2002). Apparatus for measuring surface particulate contamination (U.S. Patent No. 6382036). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6382036

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