The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 30, 2002
Filed:
Dec. 18, 1998
Robert Francis Berry, Austin, TX (US);
Rangarajan Thiruvenkata Chari, Austin, TX (US);
Riaz Yousuf Hussain, Austin, TX (US);
Robert John Urguhart, Austin, TX (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Understanding a third-party vendor's benchmark can be difficult when its source code is proprietary. In particular, the factors on which the benchmark's score depend can not easily be discovered. Furthermore, the sensitivity of the score to the execution speed of various components of the benchmark, which is important for optimizing the score in a competitive environment, is not readily accessible. The present invention shows how insertion of known delays into selected components of a benchmark can be used to elucidate its computational structure, profile it, find the sensitivity of its score to the time spent in a functional component. In all these uses of the present invention, execution of a predetermined amount of code is used to introduce a known delay into a target function or Java method. The benchmark is then re-executed to determine the delay's impact on the benchmark's score. Varying the number of iterations of the delay code, and varying the method or function in which it is inserted, are used to achieve different purposes.