The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 30, 2002
Filed:
May. 28, 1999
Edward Hsia, Saratoga, CA (US);
Phuong K. Banh, Sunnyvale, CA (US);
Darlene Hamilton, San Jose, CA (US);
Advanced Micro Devices, Inc., Sunnyvale, CA (US);
Abstract
A method of utilizing Fast Chip Erase to screen endurance rejects. Multiple sectors in a device are selected and a time necessary to program all cells in the sectors is monitored and if the monitored time exceeds a first time, the device fails. A time necessary to erase all the cells without any overerased cells is monitored and if the time exceeds a second time, the device fails. A time necessary to correct overerased cells is monitored and if the time exceeds a third time, the device fails. The total time from erase until overerase correction is achieved is monitored and if the total time exceeds a fourth time, the device fails. The total time to determine erasability is monitored and if this time exceeds a fifth time, the device fails.