The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 30, 2002
Filed:
Jul. 07, 1998
Emi Ashibe, Kyoto, JP;
Kyoto Daiichi Kagaku Co., Ltd., Kyoto, JP;
Abstract
A measurement condition setting fixture is secured to a measurement site of a living body prior to the measurement. At the time of measurement, a light irradiation section and a light receiving section of a measuring optical system are respectively attached and secured to a light irradiation section securing section and a light receiving section securing section of the measurement condition setting fixture . Thus, the measurement site and the measuring optical system are secured to each other, and desirable measurement conditions can be realized. Moreover, the measurement conditions can be maintained throughout the measurement. After the measurement is completed, the measurement site can be removed from the measuring optical system by detaching the light irradiation section and the light receiving section from the light irradiation section securing section and the light receiving section securing section . When the measurement is performed again, the desirable measurement conditions can be reproduced merely by attaching the light irradiation section and the light receiving section to the light irradiation section securing section and the light receiving section securing section