The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 30, 2002
Filed:
Nov. 10, 1998
Gengsheng Lawrence Zeng, Salt Lake City, UT (US);
Chuanyong Bai, Salt Lake City, UT (US);
Grant T. Gullberg, Salt Lake City, UT (US);
The University of Utah, Salt Lake City, UT (US);
Abstract
A method of modeling 3D first-order scatter, non-uniform attenuation, and 3D system geometric point response in an ML-EM algorithm to reconstruction SPECT data is provided. It includes performing an initial slice-to-slice blurring operation ( ) on a volume of estimated emission source data. The volume of estimated emission source data is represented by a 3D array of voxels. A voxel-by-voxel multiplying ( ) of the results from the initial slice-to-slice blurring operation ( ) by a volume of attenuation coefficients yields a volume of effective scatter source data ( ). The volume of effective scatter source data ( ) is voxel-by-voxel added ( ) to the volume of estimated emission source data to produce a volume of combined estimated emission and scatter source data. Finally, a secondary slice-to-slice blurring operation ( ) is performed on the volume of combined estimated emission and scatter source data.