The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 30, 2002
Filed:
Dec. 08, 2000
Applicant:
Inventors:
Assignee:
U.S. Philips Corporation, New York, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/00 ;
U.S. Cl.
CPC ...
A61B 6/00 ;
Abstract
Method and device for forming a 3D image of an object to be examined by combining at least two reconstruction images, acquired by an X-ray device, by weighted addition. Specifically, each reconstruction image is weighted with a respective weighting function which describes at least approximately the distribution of noise and/or the distribution of artifacts in the reconstruction image. The image quality of the resultant three-dimensional image is thus significantly improved.
Proksa, Roland. (2002). Method of combining reconstruction images (U.S. Patent No. 6381298). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6381298
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile