The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 30, 2002
Filed:
Sep. 03, 1999
Bernhard Platzer, Graz, AT;
Günter Knapp, Graz, AT;
Other;
Abstract
The invention relates to a device for analyzing gaseous samples comprising a device for generating a plasma, a feeding device for the sample to be analyzed and at least one detector unit which in particular comprises at least one interference filter, a lens arrangement and a photodetector for detecting radiation, especially atomic emission or molecular emission, emitted by the sample to be analyzed. According to the invention, said device for generating the plasma is made up of two in particular ring- or disk-shaped parallel, interspaced electrodes, wherein each electrode has one essentially centrical, especially circular through-opening, and an isolator positioned between said electrodes, said isolator having a particularly circular through-opening for confining the plasma. In addition the invention provides for an optical unit, in particular a collimator lens, to be placed between said device for generating the plasma and the detector unit for forming a parallel ray beam.