The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 30, 2002

Filed:

Jan. 18, 2000
Applicant:
Inventor:

José G. Piffaretti, Conover, NC (US);

Assignee:

Alcatel, Paris, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/100 ;
U.S. Cl.
CPC ...
G01N 2/100 ;
Abstract

The invention relates to a method of determining at least one characteristic of an optical fiber with the aid of a reflectometer, in which method the fiber to be characterized is connected at both ends to reference fibers and a reflectometer measurement is performed for each reference fiber. To determine if reflectometer data relating to the fiber to be characterized obtained after the two measurements is correct, reflectometer data corresponding to two equivalent points of the reference fibers is compared. The reflectometer data of the fiber to be characterized is retained only if the difference between the data compared is the same for both measurements. The reflectometer data compared for the two reference fibers consists of mean values for equivalent segments, for example.


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