The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 30, 2002

Filed:

Jul. 24, 2000
Applicant:
Inventors:

Wen Liu, Nepean, CA;

Steve A. Beaudin, Ottawa, CA;

Conrad F. Gratton, Casselman, CA;

Assignee:

Nortel Networks Limited, St. Laurent, CA;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03H 9/42 ;
U.S. Cl.
CPC ...
H03H 9/42 ;
Abstract

A tapered IDT function is provided in an IDT of a SAW device having fingers substantially parallel to one another by applying a static electric field to a piezoelectric substrate of the SAW device to generate in the substrate a strain which varies across the aperture of the IDT, thereby varying a center frequency of the IDT across the aperture of the IDT. The electric field can be perpendicular to the fingers and created by applying a dc voltage between conductors at least one of which can be tapered or angled, either in the region of the IDT to produce a strain directly or adjacent to the IDT to produce a strain indirectly, or it can be parallel to the fingers, two fields with opposite directions being created at the two sides of the IDT.


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