The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 30, 2002

Filed:

Oct. 25, 2000
Applicant:
Inventors:

William P. Schenck, Jr., Rockland, TN (US);

Kenneth A. Cupples, Knoxville, TN (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 2/726 ; G01F 2/300 ;
U.S. Cl.
CPC ...
G01R 2/726 ; G01F 2/300 ;
Abstract

A capacitance probe including a spacer for separating an inner conductor from an outer conductor. The spacer has a member that substantially surrounds the outer conductor and includes a number of spacing elements that extend inwardly through apertures in the outer conductor to position the inner conductor concentrically with the outer conductor. The spacers advantageously are installable from the outside of the outer conductor through apertures in the outer conductor to simplify production of the capacitance probe. The spacers also allow material to fill and drain easily between the conductors, and allow more of the material being measured to make contact with the conductors improving linearity and gain of capacitance measurement. Additional features contributing to the low cost manufacturability of the probe include ability to use conventional materials, such as longitudinal seam stainless steel tubing for the inner and outer conductors, inner conductor insulation fabricated from conventional heat shrink tubing, a relatively simple fitting including a single O-ring for coupling both the inner and outer conductors to the housing.


Find Patent Forward Citations

Schenck, Jr., William. (2002). Capacitance probe and spacer therefor (U.S. Patent No. 6380750). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6380750

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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