The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 30, 2002

Filed:

Apr. 11, 2001
Applicant:
Inventors:

Anthony Polak, Lake Zurich, IL (US);

Ji Zhu, Palatine, IL (US);

Assignee:

Motorola, Inc., Schaumburg, IL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/163 ;
U.S. Cl.
CPC ...
G01N 2/163 ;
Abstract

The present invention provides a device and methods for quantitatively detecting the presence of an analyte by referencing the analyte variant signal to an analyte invariant reference signal. The devices contain quantum dots as the invariant references. The reference quantum dots provide a fluorescent signal whose intensity in invariant with respect to the optical signal associated with the analyte concentration. Both the optical path for the analyte specific and invariant reference signal are substantially identical. Therefore, by measuring the intensity ratio of the analyte specific signal to the reference signal, errors associated with optical path length, absorptivity and scattering are eliminated.


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