The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 30, 2002
Filed:
Aug. 08, 2000
Waldermar Zylka, Hamburg, DE;
Jörg Sabczynski, Norderstedt, DE;
Jürgen Weese, Henstedt-Ulzburg, DE;
U.S. Philips Corporation, New York, NY (US);
Abstract
The invention relates to an X-ray examination apparatus for and a method of forming distortion-free X-ray images, which apparatus and method enable the imaging properties of the C-arm X-ray system to be derived from the patient image. To this end, a reference image (FIG. ) is formed in a reference orientation of the X-ray examination apparatus and the reference imaging properties of the C-arm X-ray system are determined on the basis of the positions of calibration members ( ), which are mounted on the image intensifier ( ) and/or the X-ray source ( ) and are reproduced, and the known geometry and position relative to the image intensifier ( ) and/or the X-ray source ( ); the positions of the calibration members ( ) reproduced in a patient X-ray image (FIG. ) are compared with the positions of the calibration members ( ) in the reference image (FIG. ) and distortions occurring in the patient X-ray image are corrected on the basis of differences between the reproduced positions of the calibration members ( ) in the patient X-ray image (FIG. ) and in the reference image (FIG. ).