The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 30, 2002
Filed:
Mar. 21, 2000
Oliver Schuetz, Erlangen, DE;
Matthias Mitschke, Nurernberg, DE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
An X-ray apparatus has an X-ray examination system with an X-ray source and an X-ray detector which can be displaced relative to a subject for the pickup of 2D projections, an arrangement for determining extrinsic imaging parameters and an arrangement for determining intrinsic imaging parameters, for determining the projection geometry in the examination system for each 2D projection, and having a control and computing stage for reconstructing 3D images from the 2D projections using the extrinsic and intrinsic imaging parameters. The arrangement for determining the intrinsic imaging parameters includes X-ray-positive marks which are allocated to the X-ray source and which are in the path of an X-ray beam emanating from the X-ray source, these marks following displacement of the X-ray system.