The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 30, 2002

Filed:

Sep. 22, 2000
Applicant:
Inventors:

Nicolas Chateau, Paris, FR;

Gildas Marin, Antony, FR;

Bruno Fermigier, Paris, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/00 ;
U.S. Cl.
CPC ...
A61B 3/00 ;
Abstract

A method of determining the shape of an ophthalmic contact lens for correcting optical aberrations of the eye beyond defocusing or astigmatism includes the steps of measuring the optical aberrations of the eye to be corrected, determining the shape of the rear face of the lens from the measured topography of the cornea in order to obtain a predetermined mechanical behavior of the lens when it is placed on the eye, measuring the optical aberrations of the eye to be corrected, and determining the shape of the front face of the lens from the measured optical aberrations of the eye to be corrected combined with data relating to the shape determined for the rear face of the lens in order to correct the aberrations. The system includes measurement units for measuring the topography and the aberrations of the eye and an electronic calculator unit.


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