The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 30, 2002

Filed:

Aug. 02, 2000
Applicant:
Inventors:

Charles C. Chang, Hsinchu, TW;

Chieh-Wen Wang, Hsinchu, TW;

Ming-Ling Lee, Hsinchu, TW;

Jhih-Ping Lu, Hsinchu Hsien, TW;

Chen-Yue Cheng, Hsinchu, TW;

Yuan-Liang Lan, Hsinchu Hsien, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 2/01 ;
U.S. Cl.
CPC ...
B41J 2/01 ;
Abstract

An inkjet printhead chip structure and a method of estimating the working life through the detection of any defect on the chip structure. The method includes laying a metallic layer such as a tantalum layer over the chip and then shaping the metallic layer into a protective layer circuit. A portion of the metal protective layer covers the heating elements embedded in the chip. In printing, the heating elements heat up the ink to produce jets of ink. However, a portion of the heat is transferred to the metal protective layer thereby raising its temperature. Heat on the metal protective layer combined with any strayed residual ink bubbles that impinge upon the surface of the metal protective layer causes the metal to age. Since resistance of the metal protective layer will increase proportionally to the amount of aging, a measurement of the resistance is capable of estimating how much longer a given chip is suitable for use. Furthermore, if this special circuit layout runs across each long side of an ink slot, any cracks along the direction of the ink slot are detectable during resistance measurement.


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