The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 23, 2002
Filed:
May. 06, 1999
Applicant:
Inventors:
Li-Wen Chen, Cupertino, CA (US);
Juan J. Ortiz, Hayward, CA (US);
Assignee:
MetaEdge Corporation, Sunnyvale, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/6102 ;
U.S. Cl.
CPC ...
G06F 1/6102 ;
Abstract
According to the invention, techniques for organizing information from systems in a data warehousing environment are provided. In an exemplary embodiment, the invention provides a method for analyzing data from one or more data sources of an enterprise. The method provides a meta-model based technique for modeling the enterprise data. The enterprise is typically a business activity, but can also be other loci of human activity. Embodiments according to the invention can translate data from a variety of sources to particular database schema in order to provide organization to a data warehousing environment.