The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 23, 2002

Filed:

Feb. 04, 2000
Applicant:
Inventors:

Sooyeul Lee, Taejon, KR;

Hyeon-Bong Pyo, Taejon, KR;

Seunghwan Kim, Taejon, KR;

Seon Hee Park, Taejon, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 1/502 ;
U.S. Cl.
CPC ...
G01B 1/502 ;
Abstract

A method for calibrating a trabecular index with a sawtooth-shaped rack which corrects an error in the trabecular index due to the characteristics of an image input device or radiographic conditions of an x-ray image when a bone mineral density is measured by setting up the trabecular index with trabecular patterns of a simple x-ray image. The present invention includes a method for calibrating the trabecular index with a sawtooth-shaped rack, wherein bone mineral density is measured with the trabecular index calculated from an x-ray image and an error in the trabecular index is calibrated by a method of calibrating the trabecular index, the method includes the following steps. A first step is preparing an x-ray image by radiographing a bone and a sawtooth-shaped rack together. A second step is attaining trabecular indexes from the x-ray image of the rack and the bone. And, a third step is calibrating the trabecular index of the bone with the trabecular index of the rack.


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