The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 23, 2002

Filed:

Jun. 01, 2000
Applicant:
Inventors:

David C. Lee, Guangdong, CN;

Yi Ling, Foster City, CA (US);

Yung-Cheng Lo, San Leandro, CA (US);

Steve W. McLaughlin, Decatur, GA (US);

Assignee:

Calimetrics, Inc., Alameda, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B 3/90 ;
U.S. Cl.
CPC ...
G11B 3/90 ;
Abstract

A method is disclosed for compensating for intersymbol interference on an optical disc. The method includes measuring an intersymbol linear transfer function. The intersymbol linear transfer function substantially describes a linear portion of the effect of intersymbol interference on an optically detected read signal from an optical disc. A partial response target frequency response is divided by the intersymbol linear transfer function to obtain a linear equalization filter response. A read signal from the optical disc is convolved with the linear equalization filter response. This results in the read signal being equalized and containing a controlled partial-response target intersymbol interference. There is also disclosed a method of compensating utilizing a decision feedback equalizer where the target frequency response is either a partial-response or a zero-forcing response.


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