The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 23, 2002

Filed:

Apr. 21, 1999
Applicant:
Inventor:

Guenter Schoeppe, Jena, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/30 ; G01J 3/42 ; G02B 5/04 ;
U.S. Cl.
CPC ...
G01J 3/30 ; G01J 3/42 ; G02B 5/04 ;
Abstract

A device for the adjustable coupling of wavelengths or wavelength regions into the illumination beam path of a microscope, preferably in the beam path of a confocal microscope, comprising at least one dispersive element for wavelength separation of the illumination light and at least one at least partially reflecting element arranged in the wavelength-separated portion of the illumination light for reflecting back a wavelength region in the direction of the microscope illumination, and a device for the adjustable detection of object light coming from an illuminated object, preferably in a microscope beam path, comprising at least one dispersive element for wavelength separation of the object light and means arranged in the wavelength-separated portion of the object light for the adjustable stopping down or cutting out of at least one wavelength region and deflection in the direction of at least one detector.


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