The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 23, 2002
Filed:
Mar. 24, 1999
Takahiro Hamada, Saitama, JP;
KDD Corporation, , JP;
Abstract
A waveform analysis unit divides digital data of a video signal stored in a Y memory and a C memory into small blocks, and conducts average value separation and normalization on each of the small blocks. A 1/f fluctuation measuring unit first derives a self-correlation function for each of the normalized small blocks, folds back the self-correlation function to the negative side, and conducts correction processing for making an average self-correlation function over a predetermined section equal to 0. Subsequently, the 1/f fluctuation measuring unit conducts Fourier transform on the corrected self-correlation function, derives a power spectrum, and conducts straight line approximation of the power spectrum. The 1/f fluctuation measuring unit then derives a fluctuation value of the power spectrum from the approximate straight line. An abnormality determination unit makes a determination on video quality abnormality on the basis of the variance value of the small block, coefficients of the approximate straight line derived by the straight line approximation, and the fluctuation value.