The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 23, 2002
Filed:
May. 08, 2000
S. Anders Mattsson, Maineville, OH (US);
Steve F. Russell, Ames, IA (US);
Iowa State University Research Foundation, Inc., Ames, IA (US);
Abstract
A method of deriving a pre-distorter for a corresponding non-linear amplifier is disclosed. The first step of the method is to form the pre-distorter's topology. This is done by first determining a corresponding inverse topology to the non-linear amplifier's topology. The non-linear amplifier has a topology comprising filter and non-linear amplifier elements. The inverse topology comprises corresponding inverse filter and amplifier elements to the amplifier's filter and non-linear amplifier elements. Then, those of the inverse filter and amplifier elements for which compensation with the pre-distorter is desired are selected. Any of the inverse filter and amplifier elements that were not selected are then removed from the inverse topology to form the pre-distorter's topology. Thus, the pre-distorter's topology comprises the selected inverse filter and amplifier elements. After the pre-distorter's topology is determined, a predefined input signal is applied to the non-linear amplifier. In response, measurements of selected signals of the non-linear amplifier are made. Once the measurements are made, coefficients that define the selected inverse filter and amplifier elements' are estimated. This is done in response to the measurements that were made.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile