The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 23, 2002
Filed:
May. 17, 2000
Applicant:
Inventors:
Johan Samuel Van Den Brink, Eindhoven, NL;
Rudolf Mathias Johannes Nicolaas Lamerichs, Eindhoven, NL;
Paulus Johannes Maria Folkers, Eindhoven, NL;
Arianne Margarethe Corinne Van Muiswinkel, Eindhoven, NL;
Klaas Paul Pruessmann, Zurich, CH;
Markus Weiger, Dietikon, CH;
Ulrike Dydak, Zurich, CH;
Assignee:
U.S. Philips Corporation, New York, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/00 ;
U.S. Cl.
CPC ...
G01V 3/00 ;
Abstract
A spectroscopic magnetic resonance imaging method involves sub-sampling in the k space. For example, the SENSE technique is applied in spectroscopic MR imaging. Such sub-sampling is also applied in three-dimensional MR imaging.
Quick Actions:
Van Den Brink, Johan. (2002). Magnetic resonance imaging method with sub-sampling (U.S. Patent No. 6377045). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6377045
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile