The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 23, 2002

Filed:

Jun. 23, 1999
Applicant:
Inventor:

Kaupo Palo, Haabneeme, EE;

Assignee:

Evotec OAI AG, Hamburg, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 2/164 ;
U.S. Cl.
CPC ...
G01N 2/164 ;
Abstract

A method characterizes fluorescent molecules or other particles in samples by a) monitoring fluctuating intensity of fluorescence emitted by the molecules or other particles in at least one measurement volume of a non-uniform spatial brightness profile by measuring numbers of photon counts in primary time intervals by a single or more photon detectors, b) determining at least one distribution function of numbers of photon counts, {circumflex over (P)}(n), from the measured numbers of photon counts, c) determining physical quantities characteristic to the particles by fitting the experimentally determined distribution function of numbers of photon counts, wherein the fitting procedure involves calculation of a theoretical distribution function of the number of photon counts P(n) through its generating function, defined as


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