The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 23, 2002
Filed:
Sep. 20, 1999
Richard Charles Odom, Benbrook, TX (US);
Computalog USA, Inc., Forth Worth, TX (US);
Abstract
A method of measuring characteristics of a geologic formation, using the time, energy and spatial spectra of gamma rays induced by an accelerator, which allows (i) the measurement of the photoelectric absorption (P ) factor of the formation using a gamma-ray spectrum detected from gamma rays induced in the formation, (ii) the calculation of a neutron porosity of the formation using the gamma-ray spectrum, and (iii) the determination of a bulk density of the formation using the spectroscopic measurements. The P factor may be inferred by directly mapping the spectroscopic measurements. The porosity may be calculated by relating the gamma-ray spectrum to a hydrogen content of the formation. The density may be determined by computing a gamma diffusion length of the formation based on the gamma-ray spectrum. In addition to these measurements, the resistivity of the formation and its spontaneous potential may also be measured using an electromagnetic induction system.