The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 23, 2002

Filed:

Aug. 01, 2000
Applicant:
Inventors:

Soon-moon Jung, Sungnam, KR;

Sun-cheol Hong, Incheon, KR;

Sang-eun Lee, Yongin, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 2/14763 ; H01L 2/144 ;
U.S. Cl.
CPC ...
H01L 2/14763 ; H01L 2/144 ;
Abstract

A method of forming a contact structure in a semiconductor device is provided. In this method, a semiconductor layer, an ohmic metal layer, and a barrier metal layer are formed on the surface of a semiconductor substrate on which a metal contact hole has been formed. A compound material layer having a uniform thickness is formed on the bottom, sidewalls and lower corners of the contact hole by thermally reacting the semiconductor layer with the ohmic metal layer. Accordingly, when the contact hole exposes an impurity layer and portions of an isolation layer adjacent to the impurity layer, the junction leakage current characteristics of the impurity layer and a contact resistance are improved.


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