The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 23, 2002
Filed:
Jan. 27, 2000
Felix L. Paulauskas, Knoxville, TN (US);
Timothy S. Bigelow, Knoxville, TN (US);
Thomas T. Meek, Knoxville, TN (US);
UT-Battelle, LLC, Oak Ridge, TN (US);
Abstract
A method for monitoring characteristics of materials includes placing a material in an application zone, measuring a change in at least one property value of the application zone caused by placing the material in the application zone and relating changes in the property value of the application zone caused by the material to at least one characteristic of the material An apparatus for monitoring characteristics of a material includes a measuring device for measuring a property value resulting from applying a frequency signal to the application zone after placing a material in the application zone and a processor for relating changes in the property value caused by placement of the material in the application zone to at least one desired characteristic of the material. The application zone is preferably a resonant cavity.