The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 23, 2002
Filed:
Aug. 05, 1999
Peter S. Gaal, Monroeville, PA (US);
Silviu P. Apostolescu, Monroeville, PA (US);
Anter Corporation, Pittsburgh, PA (US);
Abstract
An instrument for determining thermophysical properties of a solid sample of uniform thickness is disclosed. The instrument comprises a furnace, an elliptical mirror outside the furnace, a light source at one focus of the elliptical mirror that is closest to the elliptical mirror, a beam guide having one end at the other focus of the elliptical mirror and the other end inside the furnace, a sample holder inside the furnace capable of holding at least two diffusivity samples with the front and back surface of a sample exposed, an indexing system for moving the sample holder so as to place samples held by the sample holder in the path of light leaving the beam guide, and an infrared detector for quantifying changes in the temperature of the back surface of a sample that is in the path of the light. Methods for determining the thermal diffusivity, specific heat capacity, thermal conductivity, coefficient of thermal expansion, density, and temperature of a sample using this instrument are also disclosed.