The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 16, 2002
Filed:
May. 21, 1999
Charles L. Mitchell, Woodinville, WA (US);
Mark L. Hall, Richmond, WA (US);
Microsoft Corporation, Redmond, WA (US);
Abstract
Improved weakest condition analysis. In one embodiment, a computer-implemented method including first identifying a set of candidates of a computer program that are potentially defective, via a predetermined data flow analysis. In one embodiment, the predetermined data flow analysis may be a static single assignment analysis, or a partial redundancy analysis. Next, each of these candidates is examine via a weakest precondition analysis to determine whether the candidate actually is defective. The end result is a faster analysis, because the weakest precondition analysis is only performed on those candidates that are deemed potentially defective by the initial predetermined data flow analysis performed.