The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 16, 2002
Filed:
Nov. 26, 1997
Applicant:
Inventors:
Jeffrey A. Dean, Menlo Park, CA (US);
James E. Hicks, Jr., Newton, MA (US);
George Z. Chrysos, Marlborough, MA (US);
Carl A. Waldspurger, Atherton, CA (US);
William E. Weihl, San Francisco, CA (US);
Assignee:
Compaq Computer Corporation, Houston, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H02H 3/05 ; H03K 1/9003 ;
U.S. Cl.
CPC ...
H02H 3/05 ; H03K 1/9003 ;
Abstract
A method for sampling the performance of a computer system is provided. The computer system includes a plurality of functional units. The method selects transactions to be processed by a particular functional unit of the computer system. State information is stored while the selected transactions are processed by the functional unit. The state information is analyzed to guide optimization.