The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 16, 2002

Filed:

Feb. 18, 1998
Applicant:
Inventors:

Michael I. Mandell, Los Angeles, CA (US);

Arnold L. Berman, Los Angeles, CA (US);

Wei-Chun Wang, Temple City, CA (US);

Tong-Jyh Lee, Hermosa Beach, CA (US);

Assignee:

Hughes Electronics Corporation, El Segundo, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/750 ; G06N 7/00 ;
U.S. Cl.
CPC ...
G06F 1/750 ; G06N 7/00 ;
Abstract

A unique transistor model and methods for analyzing the model are disclosed. The transistor model of the present invention is simple and requires specification of a minimal number of parameters to simulate transistor operation. Three analysis methods are disclosed, each having unique circumstances for application A first method is premised on sampling all waveforms in the circuit and determining the operating point of the transistor. The first method assumes an input of an arbitrary periodic waveform. The first method is very flexible and may be used with a wide range of models other than the disclosed model. A second and a third method are premised on input and output waveform clipping. The second method assumes a single tone input into the transistor. The third method is a combination of features from the first and second methods. The third method is computationally efficient and assumes an arbitrary periodic input waveform.


Find Patent Forward Citations

Loading…