The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 16, 2002

Filed:

Feb. 18, 2000
Applicant:
Inventors:

M. Turhan Taner, Houston, TX (US);

Naum M. Derzhi, Sugar Land, TX (US);

Joel D. Walls, Morgan Hill, CA (US);

Assignee:

RDSP I, L.P., Houston, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 1/40 ;
U.S. Cl.
CPC ...
G01V 1/40 ;
Abstract

The invention in a first embodiment comprises a system for generating an estimate of lithological characteristics of a region of the earth's subsurface. A correlation is generated between attributes of synthetic seismic data calculated from log data from at least one wellbore penetrating said region and lithological information from said at least one wellbore. The correlation is then applied to recorded seismic data from the region of the earth's subsurface to generate the estimate.


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