The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 16, 2002

Filed:

Feb. 02, 2000
Applicant:
Inventors:

Tomohiro Fujii, Mihara, JP;

Norifumi Tasaka, Mihara, JP;

Rieko Kitahara, Mihara, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/78 ;
U.S. Cl.
CPC ...
G06K 9/78 ;
Abstract

A printing quality examining apparatus in which image data printing paper is successively taken in by a camera of a detection unit. The image data are compared with a previously taken-in reference data to detect a printing defect so that a decision as to whether printing quality is good or bad is made. The image data is averaged in time to calculate an estimated data, and the estimated data is compared with the previously taken-in reference data. When the estimated data is normal, pixels are determined to be normal. When the estimated data is unusual, the image data from the detection unit is compared with the reference data at next step so that when the image data from the detection is normal, the pixels are determined to be normal and when the image data is unusual, the pixels are determined to be defective and the paper is discharged.


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