The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 16, 2002
Filed:
Feb. 02, 1999
Michelle H. Demers, New Hill, NC (US);
Richard Wulpern, Sanford, NC (US);
Jeffery Hurley, Cary, NC (US);
John R. Grindon, Hazelwood, MO (US);
Textile/Clothing Technology Corporation, Cary, NC (US);
Abstract
Systems methods and computer program products are provided for obtaining a three-dimensional data set that is representative of a surface of a three-dimensional object. A grating pattern, having a sinusoidally varying intensity pattern, is projected onto the surface of an object. The projected grating pattern is shifted a number of times and two-dimensional deformed grating images of an area segment of the object surface are captured and stored. A two-dimensional array of optical phase values is then created. Optical phase values in the two-dimensional array are then used to generate a plurality of three-dimensional data points that represent respective points on the surface of the object. Each three-dimensional data point is found by locating, for each pixel in the detector array of pixels, a point on the surface of the object wherein a ray from a respective pixel passing through a nodal point of a detector lens is intersected by a plane of constant phase from the projected first grating pattern passing through a nodal point of a projector lens.