The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 16, 2002
Filed:
Mar. 15, 2000
Applicant:
Inventors:
Rafael Wiemker, Kisdorf, DE;
Sabine Dippel, Hamburg, DE;
Thorsten Buzug, Kiel, DE;
Martin Stahl, Kaltenkirchen, DE;
Thomas Blaffert, Hamburg, DE;
Assignee:
U.S. Philips Corporation, New York, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 2/3083 ;
U.S. Cl.
CPC ...
G01N 2/3083 ;
Abstract
The present invention relates to a method for automatically detecting contours of, for example, shutters or implants in an X-ray image. A number of closed paths is derived from the X-ray image, one of said closed paths being selected, in dependence on the contrast along the closed paths, as the contour. The closed paths may be derived from a set of line candidates on which contour pixel candidates are situated. The contour pixel candidates can be derived from a high-pass or gradient version of the X-ray image.