The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 16, 2002
Filed:
Jan. 24, 2001
Roy Daron Cideciyan, Rueschlikon, CH;
Jonathan Darrel Coker, Rochester, MN (US);
Evangelos S. Eleftheriou, Zurich, CH;
Richard Leo Galbraith, Rochester, MN (US);
Allen Prescott Haar, Essex Junction, VT (US);
Frank Ray Keyser, III, Colchester, VT (US);
David James Stanek, Rochester, MN (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Apparatus is provided for implementing high-speed and area efficient architectures for Viterbi detection of generalized partial response signals including two-way add/compare/select for improved channel speed. The two-way add/compare/select includes a two-way compare for comparing first and second state metric input values and a pair of two-way adds in parallel with the two-way compare for respectively adding the first and second state metric input values with a second input value. The second input value includes a time varying term or a constant term. The time varying terms are expressed as outputs Z of a partial matched filter or as outputs W of a matched filter. A multiplexer is coupled to the pair of two-way adds, the multiplexer receiving a selectable input controlled by the two-way compare. A pair of shifts coupled between the pair of two-way adds and the multiplexer receive a shift control input for providing metric bounding to avoid underflow. The two-way compare for comparing first and second state metric input values can include a hard shift for providing an add for the first state metric input value and then a compare between a resultant first state metric input value and the second state metric input value.