The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 16, 2002
Filed:
Sep. 18, 1998
Hajime Yamamoto, Kanagawa, JP;
Masato Iwakawa, Tokyo, JP;
NEC Corporation, Toyko, JP;
Abstract
Scanning is performed in a sub scan direction an image on a scan medium placed on a plane with a one-dimensional image sensor at a fixed position via a reflecting mirror rotatable around a fixed axis without causing a scan defect due to a change in the optical path length. An image light generating from an image on a scan medium is deflected by a reflecting mirror so at to form an image at a position of an image sensor via an image formation optical system. The image sensor reads a scan image as a one-dimensional main scan line and the reflecting mirror is rotated so at move a scan position in a sub scan direction. The rotation of this reflecting mirror is interlocked with displacement of the image formation optical system in an optical axis direction, thus enabling to prevent an image formation defect due to a change in the optical path length.