The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 16, 2002

Filed:

Dec. 28, 1999
Applicant:
Inventors:

Katsuaki Kono, Shiga, JP;

Yukio Nakagawa, Shiga, JP;

Yasushi Yamaguchi, Kyoto, JP;

Assignee:

Ishida Co., Ltd., Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01G 1/9387 ; G01G 2/301 ;
U.S. Cl.
CPC ...
G01G 1/9387 ; G01G 2/301 ;
Abstract

There is provided an abnormal device determining means (CPU ) which reads a tendency of displacement between the combination calculated weight Wc of the contents M and the post-discharge Ws measured value of the same contents M measured after such contents M have been bagged and which, based on the tendency of displacement so read, determines which one of the combination calculated value Wc and the post-discharge measured value Ws is abnormal, and a display device ( ) for displaying a result of the determination. Thus, since based on the displacement tendency of the combination calculated value Wc and the post-discharge measured value Ws, which one of the combination calculated value Wc and the post-discharge measured value Ws is abnormal is determined, it can readily and easily grasped which one of the combination weighing apparatus ( ) and the weight checker ( ) suffers from a trouble.


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