The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 16, 2002

Filed:

Feb. 16, 2001
Applicant:
Inventors:

Allan L. Smith, Bala Cynwyd, PA (US);

Ingemar Wadso, 224-67 Lund, SE;

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/902 ; G01N 9/00 ; G01K 1/700 ; G01K 1/300 ;
U.S. Cl.
CPC ...
G01N 2/902 ; G01N 9/00 ; G01K 1/700 ; G01K 1/300 ;
Abstract

Provided are a measurement apparatus and a measurement system comprising sample and reference microresonators, such as sample and reference quartz crystal microbalances; sample and reference heat flow sensors; and a heat sink coupled thermally to the heat flow sensors. These may be used to measure changes in one or more properties, such as mass, due to a liquid sample on a surface of a sample microresonator and also to measure heat flows from the sample on the surface of the sample microresonator by utilizing the heat flow sensors, which are coupled thermally to the corresponding sample or reference microresonators. Also provided is a method for measuring one or more properties, such as mass, of a liquid sample and the flow of heat from the sample to the heat sink by utilizing such apparatus.


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