The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 2002
Filed:
Apr. 22, 1999
John J. Maney, Malabar, FL (US);
Harris Corporation, Melbourne, FL (US);
Abstract
A method of automatically isolating item faults is disclosed. Subtest results T[i] are obtained for a plurality of items, where T[] comprises a vector of m subtest results and T[i]=a value if subtest i fails and subtest i does not fail, T[i]=a negative value or 0. The subtest results T[i] are multiplied or ANDed with respective matrix values Y[i,j], where Y[] comprises a predetermined m×n matrix where Y[i,j]>0 if hardware module j causes subtest i to fail and Y[i,j]≦0 if item j does not cause subtest i to fail. The results are summed in order to obtain a number S[j] for each item that is reflective of the number of subtest failures that are explained by a failure of item j, wherein any item j is suspect if S[j]>0. The item that has the most likely failure is determined by obtaining the largest value of S[j] when S[j] has multiple non-zero entries, such that the largest value of S[j] is indicative of the most likely single item failure where any other items with non-zero S[j] represent alternate possible item failures.