The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 09, 2002

Filed:

Feb. 16, 2001
Applicant:
Inventor:

Gary F. Feierbach, Belmont, CA (US);

Assignee:

Sun Microsystems, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/200 ;
U.S. Cl.
CPC ...
G06F 1/200 ;
Abstract

An adaptive memory control determines optimal values for the refresh period and row and column address strobe signal frequency of an associated DRAM. A binary test pattern is written to the DRAM array, read during a subsequent read operation, and then compared to the original test pattern. If a match, the 1's complement of the test pattern is written to the array and then compared as described above with the original 1's complement pattern. If a match, the process is repeated using a more aggressive value for the desired parameter, i.e., refresh period, strobe frequency, etc. If at any point the comparison does not result in a match, a more conservative parameter value is used for the subsequent write, read, and compare sequence. This process continues until an optimal value for each desired parameter is determined.


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