The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 2002
Filed:
Dec. 18, 1998
Yu-Chuan Chang, Taipei, TW;
Xue-Ning Ren, Shanghai, CN;
Inventec Corp., Taipei, JP;
Abstract
A method for testing n data pins of a parallel communication port. It includes the main steps of: (a) selecting an address to access a memory unit; (b) selecting a data pin to be tested and a testing data, wherein the testing data is a binary code consisting of (n—1) of first binary digits at data pins other than the data pin being selected and a second binary digit at the data pin being selected, the first binary digit being different from the second binary digit; (c) writing the testing data into the memory unit through all the data pins; (d) reading a stored data from the memory unit also through all the data pins; and (e) comparing the testing data with the stored data to diagnose the data pins, then storing the result into computer memory. The step of diagnose the data pins comprises the sub-steps of: (i) checking to see whether the binary digit of the stored data at the selected data pin is the same as the binary digit of testing data, if no, the selected data pin is open, if not, proceeding to step (ii); and (ii) checking to see whether there exists another data pin at whose location the binary digit is the same as the binary digit of the selected data pin, if yes, then there is a short circuit between the selected data pin and that data pin.