The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 09, 2002

Filed:

Apr. 17, 1995
Applicant:
Inventors:

Stefan Sieber, München, DE;

Sebald Kolb, Ottobrunn, DE;

Andreas Elstner, Fulda, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/00 ;
U.S. Cl.
CPC ...
G06F 9/00 ;
Abstract

The description of the invention relates to a process for performing tests by means of which functionality and the real-time behavior of objects derived from concurrent classes can be tested. The particular advantage of the process according to the invention is that it is not individual objects that are instrumented for test purposes, but rather that the operating system is instrumented for test purposes. Furthermore, one major advantage lies in the fact that allocation information of source code to object code is used during testing which provides the programmer with a simple means of inputting test scenarios.


Find Patent Forward Citations

Sieber, Stefan. (2002). Process for performing at least one test on at least one of the objects of an object-oriented program capable of running in parallel on a computer (U.S. Patent No. 6370589). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6370589

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…