The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 09, 2002

Filed:

Sep. 25, 1998
Applicant:
Inventor:

John G. Bartkowiak, Austin, TX (US);

Assignee:

Legerity, Inc., Austin, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/710 ;
U.S. Cl.
CPC ...
G06F 1/710 ;
Abstract

A method and system for improved detection of analog signals, where such signals are composed of one or more analog frequencies of defined duration. In the method and system, an analog signal is received. A stream of data samples is created from the received analog signal. Based on the stream of data samples, a duration is calculated for one or more analog frequencies contained within the received analog signal. The duration is calculated for the one or more frequencies by utilizing a calculated signal energy for each of the one or more analog frequencies. The calculated signal energies for each of the one or more analog frequencies are used to determine a number of frequency-specific data samples. The number of frequency-specific data samples are then utilized with a sampling rate to calculate the duration of the each of the one or more analog frequencies. The one or more calculated durations of each of the one or more analog frequencies are utilized to determine whether the analog signal, composed of the one or more analog frequencies of defined duration, is present.


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