The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 2002
Filed:
Feb. 25, 2000
Joseph M Gorin, Santa Rosa, CA (US);
David D Sharrit, Phoenix, AZ (US);
Agilent Technologies, Inc., Palo Alto, CA (US);
Abstract
A signal analyzer has an analysis scale and a display scale that are independently selectable. The signal analyzer receives a first representation of an applied signal and provides from the first representation at least two alternative representations. A first selective input enables a designated one of the alternative representations to be applied to a filter to reduce variance of the designated representation. The signal analyzer then converts the received one of the alternative representations having reduced variance to at least two alternative display scales. A second selective input enables a designated one of the alternative display scales to be displayed on a monitor, display screen or other output device of the measurement instrument or system. Independent control of the first selective input and the second selective input via a user interface enables the analysis scale—the scale, or representation, to which the filter is applied, to be selected independently of the scale on which the representation having reduced variance is displayed.