The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 09, 2002

Filed:

May. 07, 1999
Applicant:
Inventors:

Hui Hu, Waukesha, WI (US);

Jiang Hsieh, Brookfield, WI (US);

Stanley H. Fox, Brookfield, WI (US);

Kishore C. Acharya, Brookfield, WI (US);

Hui David He, Waukesha, WI (US);

Yi Sun, Waukesha, WI (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/00 ;
U.S. Cl.
CPC ...
A61B 6/00 ;
Abstract

The present invention, in one form is an imaging system for generating images of an entire object. In one embodiment, a physiological cycle unit is used to determine the cycle of the moving object. By altering the rotational speed of an x-ray source as a function of the object cycle, segments of projection data are collected for each selected phase of the object during each rotation. After completing a plurality of rotations, the segments of projection data are combined and a cross-sectional image of the selected phase of the object is generated. As a result, minimizing motion artifacts.


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