Semiconductor memory devices and methods for sampling data therefrom based on a relative position of a memory cell array section containing the data

Abstract

Semiconductor devices and methods of sampling data therefrom are provided in which data is sampled from a memory cell array based on a relative position of a memory cell array section that contains the data. A sense amplifier generates an output signal in response to an address of one or more cells in a memory cell array. A control circuit generates a sample control signal in response to at least a portion of the address (e.g., one or more high order bits of the address) of the one or more cells in the memory cell array. A data sampling circuit then samples the output signal of the sense amplifier in response to the sample control signal. The portion of the memory cell array address used to drive the control circuit may logically divide the memory cell array into two or more sections. The control circuit may adjust the timing of the sample control signal in accordance with the proximity of a memory cell array section to the sense amplifier.