The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 2002
Filed:
Nov. 01, 2000
Michael J. Mandella, Cupertino, CA (US);
Mark H. Garrett, Morgan Hill, CA (US);
Gordon S. Kino, Stanford, CA (US);
Optical Biopsy Technologies, Inc., San Jose, CA (US);
Abstract
This invention provides an angled-dual-illumination-axis confocal scanning microscope comprising a fiber-coupled, angled-dual-illumination-axis confocal scanning head and a vertical scanning unit. The angled-dual-illumination-axis confocal scanning head is configured such that two illumination beams intersect optimally at an angle &thgr; within an object and the scanning is achieved by pivoting the illumination beams and their corresponding observation beams using a single scanning element, thereby producing an arc-line scan. The vertical scanning unit causes the angled-dual-illumination-axis confocal scanning head to move towards or away from the object, thereby yielding a vertical cross-section scan of the object. The angled-dual-illumination-axis confocal scanning microscope have advantages of enhanced resolution, faster scanning, higher sensitivity and larger dynamic range of detection, a larger field of view and a longer working distance, and a compact and integrated construction.