Test clip for electrical testing of an electronic component

Abstract

A test clip is provided for electrically interfacing an electronic component to test equipment used to electrically test the component and/or an electronic unit incorporating the component. The test clip is readily aligned on and secured to the electronic component to convert the component leads into accessible test points that may be probed or easily connected to the test equipment. The test clip may include one or more replaceable contacts that can be replaced, either individually or in one or more groups, when a contact becomes damaged or worn. The replaceable contacts may include one or more lead contacts that are electrically connected to test point contacts. The lead contacts may be adjustably supported on the test clip so that they can be properly aligned with the component leads. The contacts may also include one or more replaceable interface connectors, which may be provided with a resilient interconnector, for electrically interconnecting the component leads to the lead contacts of the test clip. The test clip may be secured to an electronic component by applying a vacuum to the component body to produce a relatively large holding force therebetween.