The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 2002
Filed:
May. 14, 1999
Applicant:
Inventors:
Gideon Berlad, Haifa, IL;
Dov Maor, Haifa, IL;
Assignee:
GE Medical Systems Israel, Ltd., Tirat-Hacarael, IL;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 1/20 ;
U.S. Cl.
CPC ...
G01T 1/20 ;
Abstract
A method of reducing artifacts caused by generation of unwanted photons by scattering (e.g., Compton scattered photons) in which a detected event is spatially convoluted with a spatial filter function. The filter function has a distribution of weights within the filter function that is dependent on the energy of the event for a same primary event energy.